Hello everybody, I recently tried to lighly diffused silicon by Boron. The expected concentration is around 5e17 atoms/cm3. I reduced the temperature to 800C, and pre-diffused in 15 minutes. For drive-in, I made at 1100C/30minutes. I estimated the concentration should be 1e18 atoms/cm3 by Frick's law. However, after the process, I can not measure the sheet resistance of doped wafer. The based concentration of the n-type wafer is 1e17 atoms/cm3, and I doped it succesfully with the prediffusion temperature of 1000C. Is boron solubility a problem, or the based concentration too high? By the way, I can not dope the silicon by ion implantation method here. I really appreciate any ideas or suggestions. Best regards ============== Dau Thanh Van Ritsumeikan Uni. ==============