Hi Maryla, I've had similar problems with LPCVD 2micron thick SiN. Typically, the nitride is under tension while the oxide is under compressive stress. I'm assuming that you want to release a stack of SiO2 and nitride together. If that is the case you might consider using a thicker oxide (or thinner nitride) to help cancell the stresses in the suspended membrane. -Mike Martin U. of Louisville >>> rmk111@rsphysse.anu.edu.au 01/10/05 6:20 AM >>> Hi all I was wondering if someone could help me. I am trying to etch SiO2/Si3N4 membranes in 100 Si wafer. The thickness of the Si3N4 and thermal oxide layers are 100nm and 2.5micron, respectively. The Si3N4 layer is removed by the RIE , while SiO2 in BHF and then etched in KOH to produce the window membrane. Unfortunately, each time I repeat my process the membranes brake. Could someone advise me why this is happening and suggest solution to this problem. Also, what are the best conditions for fabrication of the SiO2 membranes? Thank you very much in advance. Maryla _______________________________________________ MEMS-talk@memsnet.org mailing list: to unsubscribe or change your list options, visit http://mail.mems-exchange.org/mailman/listinfo/mems-talk Hosted by the MEMS Exchange, providers of MEMS processing services. Visit us at http://www.memsnet.org/