Dear all,

I am now working on the design and characterisation of multi-layer
structures for efficient mid- or far-infrared radiation absorbers. I not
sure how to measure the absorption of the fabricated structure, for
example, a metal/Si/metal sandwich structure. In our group we can only
conduct transmission measurement. So how can we extract absorbance from the
transmission data? Please give me some hints if you have any experience in
this. Thanks very much.

Cheers,

--
Da-xiang Zhou
PhD candidate
Semiconductor Physics Group
Cavendish Laboratory
University of Cambridge