Greg, Thanks very much. I may be back with more questions, but that gives me a good starting point. Art -----Original Message----- From: mems-talk-admin@memsnet.org [mailto:mems-talk-admin@memsnet.org] On Behalf Of Greg Mattiussi Sent: Monday, January 21, 2002 10:21 AM To: mems-talk@memsnet.org Subject: RE: [mems-talk] Non-Chromium Trioxide Defect Etch > Looking for a non-CrO3 etch for finding dislocation, slip, and stacking > fault defects in 100 Si slices. Hi ! There is a silicon etch (called the Sato etch) that was published by researchers at Toshiba Ceramics Co. that I have used with excellent results: HF (49%) : HNO3 (70%) : CH3COOH (90%) : H2O = 1 : 15 : 3 : 1 This etches silicon at a rate of about 4.2 microns/minute, and delineates dislocations and stacking faults very well. It is heavy on the nitric acid, which acts as the oxidizing agent instead of the chromium trioxide. I'm sorry my reply took so long, but I had to dig up the reference from my notes. Cheers, Greg Mattiussi _______________________________________________ mems-talk@memsnet.org mailing list: to unsubscribe or change your list options, visit http://mail.mems-exchange.org/mailman/listinfo/mems-talk Hosted by the MEMS Exchange, providers of MEMS processing services. Visit us at http://www.mems-exchange.org/