Hi,

I am looking for a method of checking frontside-to-backside alignment at
develop inspect.  The photoresist pattern (on both sides of the silicon
wafer) is a little over a micron thick.  Years ago, AO (American Optical)
offered such a microscope. All suggestions will be appreciated.

Thanks in advance,
Roger Brennan

Endevco
355 N. Pastoria Avenue
Sunnyvale, CA 94085
(408)-739-3533 ext 204
roger.brennan@endevco.com

1403 Forrestal Ave.
San Jose, CA 95110
(408)-453-0711
rogerbr@earthlink.net
Roger Brennan