Ellipsometer can do that for you. What you need to do is just to input the parameters of your layers. good luck weibin ----- Original Message ----- From: "adnan merhaba"To: Sent: Wednesday, August 21, 2002 5:19 AM Subject: [mems-talk] film thickness measurements > Hello all, > > I am looking for an instrument which will > non-destructively measure film thickness of sandwiched > Nickel between gold on ceramic substrates. Two other > factors that I have to consider are: > 1. The areas from which measurements are taken are > typically 25 square mils. > 2. Costs should not be very prohibitive. > > Thank you, > Regards, > Adnan > HotJobs - Search Thousands of New Jobs > http://www.hotjobs.com > _______________________________________________ > MEMS-talk@memsnet.org mailing list: to unsubscribe or change your list > options, visit http://mail.mems-exchange.org/mailman/listinfo/mems-talk > Hosted by the MEMS Exchange, providers of MEMS processing services. > Visit us at http://www.memsnet.org/