durusmail: mems-talk: SiO2 cracking problem
SiO2 cracking problem
2007-07-12
SiO2 cracking problem
Michael D Martin
2007-07-13
Sample heating durring deposition?  How big are the TCE mismatches?  Maybe you
should try cooling the sample?  Or maybe stoichiometry changes during deposition
(i.e. leaving the film silicon rich) so that the sample oxidizes upon exposure
to air.  If this is the case then you might consider doing the deposition in a
background of oxygen.

-Mike


>>>  7/12/2007 1:44 PM >>>
We've been evaporating 250nm thick layers of SiO2 (for antireflection
coatings) using an ebeam evaporator on GaN and on sapphire. The samples
appear fine when we unload them from the chamber but when we start
unmounting the GaN sample, cracking of the oxide occurs. The sapphire
sample remains fine. Any ideas? We tried a plasma ash before hand on
both samples but still saw the cracking and also made sure the samples
were in good contact (for thermal purposes) with the metal mount.
Thanks
--John, Boston University Photonics
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