Hello All,

I am interested in measuring stress and CTE of thin films as function of
temperature. The range that I am looking is from room to 750 deg C. I am looking
into instruments which can give me these measurements. I have looked into Toho
Technologies Flexux profilometer but this instrument can heat my samples only
upto 500 deg C and also the rate of increase in temperature is slow (2 deg/min)
for my applications. I also heard that Toho made instruments in the past which
could go upto 900 deg C. They do not make these instruments any more and the
sales person did mention that someone in some univeristy might still have those
old instruments. so, now you all know my situation, please let me know if any
one can help me in this regard.

Thanks,

Gary