You are the 2nd person in a month to ask this question. I replied to the earlier request, and attach a copy of that reply here. In short, however: my MOSFET experience tells me polyimide on GaAs/AlGaAs will not workin reducing surface states/traps. No cleaning process will achieve your goal, in my opinion: you have to do a 'clean' deposition process, followed by an appropriate anneal. Nothing else will come close. ++++++++++++ (previous reply follows) A high-quality (that is, low surface state density) oxide does not exist for GaAs. This has been known 'forever', and is why Si MOSFETs are the dominant electronic device by far. (As a benchmark, the surface state density for Si- SiO2 is equal to or less than 1E10 cm^-2.) On the other hand, there have been some papers which show possible approaches. One is: Nitride-based passivation of GaAs for reduced surface state density Hariu, T. Suzuki, N. Matsushita, K. Shibata, Y. IEEE International Electron Devices Meeting, 1978 Page(s): 598 - 599 They use gallium oxynitride deposited on GaAs, with a nitrogen anneal. Al2O3 insulator is used in: Microelectronics Reliability Volume 47, Issue 12, December 2007, Pages 2082-2087 Electrical measurements of voltage stressed Al2O3/GaAs MOSFET Z. Tanga, P.D. Yeb, D. Leea and C.R. Wiea Frankly, the VT shifts and gate current look awful, but no mention is made of SS density. ALD Al2O3 is discussed in the next reference, which suggest good characteristics are at least possible: Processing and Characterization of III-V Compound Semiconductor MOSFETs Using Atomic Layer Deposited Gate Dielectrics Book Series Advanced Microelectronics ISSN 1437-0387 Volume Volume 27 Book Advanced Gate Stacks for High-Mobility Semiconductors Publisher Springer Berlin Heidelberg DOI 10.1007/978-3-540-71491-0 Copyright 2007 ISBN 978-3-540-71490-3 (Print) 978-3-540-71491-0 (Online) DOI 10.1007/978-3-540-71491-0_16 Pages 341-361 Subject Collection Engineering SpringerLink Date Tuesday, January 01, 2008 Finally, Ga2O3(Gd2O3) ALD oxide insulator is used in the last ref, again with purported good effect (but for me the gate leakage is very, very high): Jpn. J. Appl. Phys. 46 (2007) pp. 3167-3180 III-V Metal-Oxide-Semiconductor Field-Effect Transistors with High κ Dielectrics Minghwei Hong, J. Raynien Kwo1, Pei-chun Tsai, Yaochung Chang, Mao-Lin Huang, Chih-ping Chen, and Tsung-da Lin Al Henning ahenning@nanoink.net -----Original Message----- From: dai truong [mailto:daitruongvl@yahoo.com] Sent: Monday, August 30, 2010 8:04 AM To: General MEMS discussion Subject: [mems-talk] Surface traps Hi all, How do you reduce the surface traps in GaAs/AlGaAs MISFET? Before and after insulator deposition (I use polyimide SU-8 2000.5), do I have to do any cleaning process? I only use ACE to clean wafers. Thanks in advance.