durusmail: mems-talk: Interchangeable test fixture for MEMS devices
Interchangeable test fixture for MEMS devices
2013-04-10
2013-04-12
Interchangeable test fixture for MEMS devices
Nathan McCorkle
2013-04-12
are the contact pads electrical or fluidic?


On Mon, Apr 8, 2013 at 7:47 PM, Shuo Cheng  wrote:

> Hi,
>
> I want to test a whole bunch of chips that have 30 440 um x 440 um contact
> pads, with a pitch of 880 um. Since the functionality of these devices are
> high unpredictable, I want to build a reusable fixture where chips can be
> interchanged rapidly. These devices are electron emitters, so the fixture
> needs to be open on the front side and be vacuum compatible. Is there any
> easy and cheap way of doing this? I think this may be a pretty standard
> task for MEMS people. Any suggestion would be greatly appreciated.
>
> Shuo
>
> --
> Shuo Cheng, PhD
> Postdoctoral Associate
> Microsystems Technology Laboratories
> Massachusetts Institute of Technology
> Rm: 39-627
> Office phone: 617-452-4903
> _______________________________________________
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--
-Nathan
_______________________________________________
Hosted by the MEMS and Nanotechnology Exchange, the country's leading
provider of MEMS and Nanotechnology design and fabrication services.
Visit us at http://www.mems-exchange.org

Want to advertise to this community?  See http://www.memsnet.org

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