We are interested in shock testing data on both surface michomachined devices
and bulk silicon mems, such as actuators, mirrors, shutters, etc. There are two
ranges of interest, low, brief shocks (mishandling, dropping from 5 to 40 feet,
etc.- after packaging that is) and their survivability in the range of kG's. If
you have any information you wish to share or know of a potential source,
please respond to the mems@isi.edu address rather than my own so that any other
interested parties may also share in it. Thank you!

shirley
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Shirley Kidner
E-mail: shirley@kidner.chinalake.navy.mil
06/05/95
13:30:35
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