I am searching for institutions/companies that may have an ellipsometer for
directly measuring thin film (metal and dielectric) optical constants (n and k)
in the region from 8 to 15 microns (i.e., 1250/cm to 667/cm or 3.75e13 Hz to
2.00e13 Hz or 0.16eV to 0.083 eV).

My literature search to date has suggested that the only such devices exist in
Europe (France and Germany).

I would appreciate any leads on any such devices either commercially available
or "jerry-rigged" in some lab. The application is for a MEMS-related
pyroelectric detection system.

-thanks

Raed Rizq
"rizo@me.umn.edu"
University of Minnesota