Reply to:   RE>FWD>Field Emission Devices (FED)

The sharpest characterized is the paper by Bob Marcus from Bellcore, which I
think were fabricated by Johann Trujillo. Anyways, Marcus examined sharpened
silicon tips which were on the order of 10 A radius, or atomic resolution.
There exist several approaches to sharpen tips, but in general those applying
FECs for displays do not necessarily have optimally sharpened tips, mainly
because of process incompatability.
--Jeff

--------------------------------------
Date: 6/28/96 7:07 PM
To: Jeff Morse
From: Peter Krulevitch
Jeff -- you may (or may not) want to respond to this:

--------------------------------------
Date: 6/28/96 7:05 PM
From: mems@ISI.EDU
Dear Members,
        I wonder if anyone know what the sharpest tip, fabricated
by micro machining technique for use in a field emission device, is.
Please provide the value with full details of the reference. I
apologize in advance if this is happened to be a well known fact.

Thanks
--
Bahram Ghodsian

School of Engineering Science               voice: 604-294 1985
Simon Fraser University                       fax: 604-291 4951
Burnaby, BC, V5A 1S6, Canada                 ghodsian@cs.sfu.ca


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From: Bahram Ghodsian 
Subject: Field Emission Devices (FED)
Date: Thu, 27 Jun 1996 23:50:58 -0700 (PDT)
To: MEMS@ISI.EDU
X-Url: http://mems.isi.edu/mems.html
Reply-To: mems@ISI.EDU