Hi Yanjun, You can measure the resonance frequency with an AFM indeed if the frequency is lower that the max freq. of the AFM (400kHz?). This is definitely the case for your dimensions. You just need a reflective pad at the free end of the cantilever, and make the substrate such that it fits in the AFM head. The spring constant can be measured in the AFM as well; bending your cantilever with an AFM cantilever, or just simply calculating it. Check for details: R. Kazinczi, J.R. Mollinger, A. Bossche, Proc. IEEE Micro Electro Mechanical Systems, pp. 229-234, 2000, Miyazaki, Japan Good luck, Robert Robert Kazinczi robert.kazinczi@cavendish-kinetics.com > -----Original Message----- > From: mems-talk-admin@memsnet.org [mailto:mems-talk-admin@memsnet.org] On > Behalf Of Yanjun(David) Tang > Sent: Thursday, October 24, 2002 7:06 AM > To: mems-talk@memsnet.org > Subject: [mems-talk] Mechanical property measurement of cantilever > > Hi,folks > I'm trying to measure the mechanical properties of silicon dioxide > microcantilever, such as spring constant, resonant frequency, etc. The > geometry of cantilever is about 200*150*1micron. Do you have suggestions > about how to do the job? What kinds of instruments are needed? I heard > that AFM can be used to measure. I just don't know how? Any opinions will > be appreciated. Thanks. > > Best regards > > Yanjun(David) Tang > > Graduate student > Institute for Micromanufacturing > Louisiana Tech University > > 1401 Tech Farm Rd. Apt. #238, Ruston, LA 71270, USA > Email: yta001@coes.latech.edu > tang_yanjun@yahoo.com > > Tel: 1-318-255-5133